14444:
Helios 650 Ultra Resolution Dual Beam FEG SEM
Internal hourly rate for Helios 650 Ultra Resolution Dual Beam FEG SEM usage. Does not include Ion Beam Surcharge or Staff Operation of Equipment, if applicable.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$91.00/Hour
- Submitted By:
-
Nichole Havranek
- Requester:
-
- Updated:
-
4/3/2023
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios 650
Helios 650 internal rate
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$91.00/Hour
- Submitted By:
-
Nichole Havranek
- Requester:
-
- Updated:
-
4/3/2023
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios 650
Helios 650 internal rate
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$91.00/Hour
- Submitted By:
-
Nichole Havranek
- Requester:
-
- Updated:
-
3/31/2022
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios 650
Helios 650 internal rate
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$91.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
6/24/2021
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Rate with Ion Beam
Helios - Rate with Ion Beam. Internal Fee
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$114.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
4/16/2021
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$112.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
6/15/2020
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$76.00/Hour
- Submitted By:
-
Meghan Tompkins
- Requester:
-
- Updated:
-
6/27/2019
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$76.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/7/2018
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
2/23/2017
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
2/19/2016
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/23/2015
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Per Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/23/2015
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|