Fee Details:

14444: Helios 650 Ultra Resolution Dual Beam FEG SEM

Internal hourly rate for Helios 650 Ultra Resolution Dual Beam FEG SEM usage. Does not include Ion Beam Surcharge or Staff Operation of Equipment, if applicable.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$91.00/Hour
Submitted By:
Nichole Havranek
Requester:
LaRae Wallace
Updated:
4/3/2023
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

History:

14444: Helios 650

Helios 650 internal rate
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$91.00/Hour
Submitted By:
Nichole Havranek
Requester:
Updated:
4/3/2023
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios 650

Helios 650 internal rate
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$91.00/Hour
Submitted By:
Nichole Havranek
Requester:
Updated:
3/31/2022
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios 650

Helios 650 internal rate
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$91.00/Hour
Submitted By:
LaRae Wallace
Requester:
Updated:
6/24/2021
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Rate with Ion Beam

Helios - Rate with Ion Beam. Internal Fee
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$114.00/Hour
Submitted By:
LaRae Wallace
Requester:
Updated:
4/16/2021
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$112.00/Hour
Submitted By:
LaRae Wallace
Requester:
Updated:
6/15/2020
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$76.00/Hour
Submitted By:
Meghan Tompkins
Requester:
Updated:
6/27/2019
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$76.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
5/7/2018
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$72.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
2/23/2017
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$72.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
2/19/2016
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$72.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
5/23/2015
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14444: Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
Yes
External:
No
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$72.00/Per Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
5/23/2015
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

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