14396:
Ion Beam Surcharge - Helios 650
External hourly surcharge rate for the use of the Ion Beam cutting tool to be utilized with the Helios. This surcharge is in addition to any hourly equipment usage charges.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$330.00/Hour
- Submitted By:
-
Nichole Havranek
- Requester:
-
- Updated:
-
4/3/2023
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$330.00/Hour
- Submitted By:
-
Nichole Havranek
- Requester:
-
- Updated:
-
4/3/2023
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$330.00/Hour
- Submitted By:
-
Nichole Havranek
- Requester:
-
- Updated:
-
3/31/2022
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$330.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
4/16/2021
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$330.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
5/4/2020
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$310.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
3/26/2019
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$310.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
3/19/2018
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$310.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
3/13/2017
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$270.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
2/19/2016
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$270.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/20/2015
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14396:
Helios - Dual Beam Instrument FIB Nanometer Cutting Tool
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
No
- External:
-
Yes
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$270.00/Per Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/20/2015
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|